var fDesc=new Array();
fDesc[0] = "WAFERMAP is an award winning software package used to collect, edit, analyze and visualize measured physical parameters on semiconductor wafers. WAFERMAP can import data files from various metrology tools such as ellipsometers, thickness gauges and four point probes. The imported data can then be visualized or printed as line scans, contour plots, 2D or 3D plots or as a histogram.";

function tShowHide(id, show)
{
	var s = document.getElementById("desc");

	if ((s.innerHTML.length<=212 || show==1) && show!=2)
	{
		s.innerHTML = fDesc[id];
		if (document.getElementById('m1'))
			document.getElementById('m1').style.display='none';
		if (document.getElementById('m2'))
			document.getElementById('m2').style.display='none';
		if (document.getElementById('more_txt'))
			document.getElementById('more_txt').style.display='inline';
	}
	else
	{
		s.innerHTML = '';
	}
}