var fDesc=new Array();
fDesc[0] = "Gwyddion is a modular program for SPM (scanning probe microscopy) data visualization and analysis. Primarily it is intended for analysis of height fields obtained by scanning probe microscopy techniques (AFM, MFM, STM, SNOM/NSOM), however it can be generally used for any other height field and image analysis, for instance for analysis of profilometry data.";

function tShowHide(id, show)
{
	var s = document.getElementById("desc");

	if ((s.innerHTML.length<=212 || show==1) && show!=2)
	{
		s.innerHTML = fDesc[id];
		if (document.getElementById('m1'))
			document.getElementById('m1').style.display='none';
		if (document.getElementById('m2'))
			document.getElementById('m2').style.display='none';
		if (document.getElementById('more_txt'))
			document.getElementById('more_txt').style.display='inline';
	}
	else
	{
		s.innerHTML = '';
	}
}